ANSI EIA-364-32C-2000 pdf free download.Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets
1.1 Scope
This test is conducted for the purpose of determining the resistance of a given electrical
connector or socket to exposure at extremes of high and low temperatures and to the shock of
alternate exposures to these extremes, simulating the worst probable conditions of storage,
transportation and application.
NOTE — This procedure includes the provision for testing at cryogenic temperatures.
Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.
2 Test resources
2.1 Equipment
2.1.1 A thermal shock chamber or two separate chambers (hot and cold) shall be used for the
extreme temperature conditions.
2.1.2 When applicable, a dewar large enough to hold a sufficient amount of liquid nitrogen to
completely engulf the specimen shall be utilized.
2.1.3 The air temperature of the chamber shall be held at each of the extreme temperatures by
means of air circulation and sufficient thermal capacity so that the ambient temperature within
the chamber shall reach the specified temperature within 2 minutes after the specimens have been
transferred to the appropriate chamber.
2.1.4 When two separate chambers (hot and cold) are used the specimens shall be supported in
the test chamber on metal screens or grills having at least 75% open area.
2.1.5 Transfer of the specimens from one chamber to the another or to dewar of liquid nitrogen
shall be performed with thermally insulated handling equipment or gloves in order to minimize
direct heat conduction.
3 Test specimen
3.1 Description
A test specimen shall consist of a plug, a receptacle, or a mated plug and receptacle, as defined
in the referencing document.
3.2 Preparation
3.2.1 The test specimen shall be assembled with contacts, wires and sealing plugs, prior to the
test, unless otherwise specified.
3.2.2 The wire lengths shall be of sufficient continuous length to interconnect the test specimen
and test equipment, as may be specified for pre- and post-test measurements.
3.2.3 Specimens not normally equipped with an integral coupling device shall be maintained in
the simulated mated condition by a suitable fixture. The fixture shall be made as light weight as
possible and of low thermal capacity material, in order to reduce “heat sink” effects that would
reduce the severity of thermal shock. For specimen mass determination prior to wiring the
specimen; see 4.3.
4 Test procedure
4.1 Mounting
The specimens shall be placed in such a position with respect to the air stream that there is
substantially no obstruction to the flow of air across and around each specimen. When special
mounting is required, it shall be specified.
4.2 Initial measurements
Specified measurements shall be made prior to the first cycle, and they shall be made at standard
ambient conditions.
4.3 Specimen mass determination
Before cycling, the combined mass of the assembly (mated, if applicable) to be tested shall be
determined. The mass shall include contacts, sealing plugs and specimen accessories attached to
the specimen and wire. The weight of any fixture used to hold the specimens in the mated
condition shall also be determined. The mass of the specimen in table 1 is the total mass of the
mated assembly, wire and any fixture attached to the specimen. The mass of wiring to the
specimens (e.g. polarizing voltage, low level contact resistance measurements, or when testing
cable assemblies) in the confines of the chamber shall be included in the mass determination.
4.4 Cycling
4.4.1 The specimen shall be placed in the test chamber as outlined in 4.1.
4.4.2 The specimen shall than be subjected to the specified condition of table 2 or 3. The first
five cycles shall be run continuously. If the desired number of cycles exceeds five it is
recommended that 25, 50, or 100 cycles be specified in the referencing document. After five
cycles, the test may be interrupted after the completion of any full cycle and the specimens
allowed to return to room ambient temperature before testing is resumed. One cycle consists of
steps 1 through 4 of the applicable test condition.
